Credits: 1 (1-0-0)
Description
Relevance of advanced characterization techniques in material development; scattering techniques (SAXS/WAXS); advanced surface characterization techniques (X-ray photoelectrosn spectroscopy (XPS), Auger electron spectroscopy (AES), secondary ion mass spectroscopy (SIMS)); microscopy techniques: basics of electron- materials interaction; SEM combined with FIB techniques; TEM and cryo-TEM; chemical analysis utilizing microscopy techniques; AFM; confocal laser microscopy.