Credits: 3 (0-0-6)
Description
In this course, the emphasis is given on some advanced experiments related with materials characterization, such as X-ray diffraction, X-ray fluorescence, determination of transition temperature in a high temperature superconductor, frequency dependence of dielectric constants, Lock-in detection technique, Solar cells, Minority carrier life-time measurements, capacitance-voltage measurements on semiconductor devices, current-voltage characteristics of varistors, synthesis and electrical characterization of thermistors, disaccommodation factor in ferrites, scanning tunneling microscopy, ellipsometry, closed cycle refrigerator, etc.