Credits: 3 (3-0-0)
Prerequisites: MLL701 or equivalent for PG, MLL102 or equivalent for UG
Description
Representation of crystallographic texture (pole figure, orientation distribution, representation in orientation space, volume fraction of texture components), experimental determination of texture using X-Ray diffraction, texture measurements using synchrotron X-Rays, scanning electron microscopy (SEM) and transmission electron microscopy (TEM), texture evolution during metal solidification and during phase transformation, texture during material deformation, texture during material heat treatment (annealing), texture in thin films, influence of texture on material properties, texture control in engineering materials with examples.